About this scholarly article

2008 17th Asian Test Symposium - USB2.0 Logic Built In Self Test Methodology by Boey, Kean Hong; Yap, Kok Sing; Ng, Wai Mun is a scholarly article available to read on EtoBox.

Author

Boey, Kean Hong; Yap, Kok Sing; Ng, Wai Mun

Publisher

IEEE

Published

2008