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About this Engineering article
Pore Size Distributions in Nanoporous Methyl Silsesquioxane Films as Determined by Small Angle X-ray Scattering by Huang, E.; Toney, M. F.; Volksen, W.; Mecerreyes, D.; Brock, P.; Kim, H.-C.; Hawker, C. J.; Hedrick, J. L.; Lee, V. Y.; Magbitang, T.; Miller, R. D.; Lurio, L. B. is a Engineering article available to read on EtoBox.
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- Author
- Huang, E.; Toney, M. F.; Volksen, W.; Mecerreyes, D.; Brock, P.; Kim, H.-C.; Hawker, C. J.; Hedrick, J. L.; Lee, V. Y.; Magbitang, T.; Miller, R. D.; Lurio, L. B.
- Publisher
- American Institute of Physics; AIP Publishing (ISSN 0003-6951)
- Published
- 2002
- Field
- Engineering (Physical Sciences)