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About this Engineering article
Fabrication and Electrical Characterization of Fully CMOS-Compatible Si Single-Electron Devices by Koppinen, P. J.; Stewart, M. D.; Zimmerman, Neil M. is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- Koppinen, P. J.; Stewart, M. D.; Zimmerman, Neil M.
- Publisher
- IEEE; Institute of Electrical and Electronics Engineers; Institute of Electrical and Electronics Engineers (IEEE) (ISSN 0018-9383)
- Published
- 2013
- Language
- EN
- Field
- Engineering (Physical Sciences)
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