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Monte Carlo Simulation With Incremental Damage for Reliability Assessment of Power Electronics by Sangwongwanich, Ariya ;Blaabjerg, Frede is a Engineering article available to read on EtoBox.

It is typically read by researchers, students, and practitioners in Engineering.

Author
Sangwongwanich, Ariya ;Blaabjerg, Frede
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Published
2020
Field
Engineering (Physical Sciences)

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