About this scholarly article

2013 IEEE 63rd Electronic Components and Technology Conference - Advanced in situ characterization of TIM1 reliability by Li, Peng; Liu, Yongmei; Mar, Alfred La; Goyal, Deepak is a scholarly article available to read on EtoBox.

Author

Li, Peng; Liu, Yongmei; Mar, Alfred La; Goyal, Deepak

Publisher

IEEE

Published

2013