About this scholarly article

2012 4th IEEE International Memory Workshop - A Investigation of E/W Cycle Characteristics for 2y-nm MLC NAND Flash Memory Devices by YeonJoo Jeong, ; Sangjo Lee, ; Sunghoon Cho, ; Pyunghwa Kim, ; Milim Park, ; SungPyo Lee, ; Hyunyoung Shim, ; Myoung Kwan Cho, ; Kun-Ok Ahn, ; Gihyun Bae, ; Sungwook Park, is a scholarly article available to read on EtoBox.

Author

YeonJoo Jeong, ; Sangjo Lee, ; Sunghoon Cho, ; Pyunghwa Kim, ; Milim Park, ; SungPyo Lee, ; Hyunyoung Shim, ; Myoung Kwan Cho, ; Kun-Ok Ahn, ; Gihyun Bae, ; Sungwook Park,

Publisher

IEEE

Published

2012

Language

EN