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About this Materials Science article
Structural Characterization of the Epitaxial Realignment of Polycrystalline Silicon Films by F. Benyaïch; F. Priolo; E. Rimini; C. Spinella; P. Ward is a Materials Science article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Materials Science.
- Author
- F. Benyaïch; F. Priolo; E. Rimini; C. Spinella; P. Ward
- Publisher
- Elsevier Science; Elsevier ; Elsevier BV (ISSN 0254-0584)
- Published
- 1992
- Language
- EN
- Field
- Materials Science (Physical Sciences)
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