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TEM Analysis of an Alumina Bicrystal Section Using a Fib by Fairer, Jeffrey K.; Ravishankar, N.; Michael, Joseph R.; Barry Carter, C. is a Materials Science article available to read on EtoBox.

What is TEM Analysis of an Alumina Bicrystal Section Using a Fib about?

Grain boundary migration (GBM) during the sintering and densification of a polycrystalline ceramic material occurs as a result of mass transport across an interface. When there is a liquid film present, either due to additives used for liquid-phase sintering or unavoidable impurities in the material, the mass transport can be visualized in terms of dissolving material from one grain and precipitating it on another. in order to study the effects of crystallography on GBM in the presence of a liquid phase, alumina bicrystals have been fabricated with anorthite (CaA12Si208) glass films at the interface. The alumina-anorthite system in a bicrystal geometry is used because the pseudo-binary phase diagram of the system is well known, the bicrystal geometry allows for control over the original interface misorientation, and the glassy phase of anorthite is the most commonly occurring glass in commercially used alumina. Fig. 1 is a secondary-electron SEM image of an alumina bicrystal recorded using a field-emission SEM (Hitachi S900) operating at 5 kV.

Who reads TEM Analysis of an Alumina Bicrystal Section Using a Fib?

Author

Fairer, Jeffrey K.; Ravishankar, N.; Michael, Joseph R.; Barry Carter, C.

Publisher

Oxford University Press (OUP)

Published

2001

Language

EN

ISBN

9781431927609

Field

Materials Science (Physical Sciences)