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About this Engineering article
Influence of majority carrier accumulation in the SIT with a high-purity channel on voltage amplification factor by Yano, K.; Kim, C.-W.; Kimura, M.; Tanaka, A.; Motoyama, S.-I.; Sukegawa, T. is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- Yano, K.; Kim, C.-W.; Kimura, M.; Tanaka, A.; Motoyama, S.-I.; Sukegawa, T.
- Publisher
- IEEE; Institute of Electrical and Electronics Engineers; Institute of Electrical and Electronics Engineers (IEEE) (ISSN 0018-9383)
- Published
- 1993
- Language
- EN
- Field
- Engineering (Physical Sciences)
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