About this scholarly article

Proceedings of the IEEE 1999 Custom Integrated Circuits Conference (Cat. No.99CH36327) - New experimental methodology to extract compact layout rules for latchup prevention in bulk CMOS IC's by Ming-Dou Ker, ; Wen-Yu Lo, ; Chung-Yu Wu, is a scholarly article available to read on EtoBox.

Author

Ming-Dou Ker, ; Wen-Yu Lo, ; Chung-Yu Wu,

Publisher

IEEE

Published

1999

Language

EN