About this scholarly article

Proceedings of 1994 IEEE/CHMT 10th Semiconductor Thermal Measurement and Management Symposium (SEMI-THERM) - GaAs MMIC thermal modeling for channel temperatures in accelerated life test fixtures and microwave modules by Wilson, J.; Decker, K. is a scholarly article available to read on EtoBox.

Author

Wilson, J.; Decker, K.

Publisher

IEEE

Published

1994