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About this Engineering article
Reliability of silicon and gallium arsenide Ka-bandIMPATT diodes: P. Staecker, W. T. Lindley, R. A. Murphy and J. P. Donnelly. Proc. IEEE Reliab. Phys. Symp. 293 (1974) is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Publisher
- Elsevier Science; Elsevier ; Elsevier BV (ISSN 0026-2714)
- Published
- 1975
- Field
- Engineering (Physical Sciences)