About this scholarly article

SPIE Proceedings [SPIE Optical Science and Technology, SPIE's 48th Annual Meeting - San Diego, CA (Sunday 3 August 2003)] Wavelets: Applications in Signal and Image Processing X - Multiresolution-fractal feature extraction and tumor detection: analytical modeling and implementation by Iftekharuddin, Khan M.; Parra, Carlos; Unser, Michael A.; Aldroubi, Akram; Laine, Andrew F. is a scholarly article available to read on EtoBox.

Author

Iftekharuddin, Khan M.; Parra, Carlos; Unser, Michael A.; Aldroubi, Akram; Laine, Andrew F.

Publisher

SPIE

Published

2003