About this scholarly article

SPIE Proceedings [SPIE SPIE's 1993 International Symposium on Optics, Imaging, and Instrumentation - San Diego, CA (Sunday 11 July 1993)] Multilayer and Grazing Incidence X-Ray/EUV Optics II - High-resolution x-ray scatter and reflectivity study of sputtered IR surfaces by Christensen, Finn E.; Abdali, Salim; Hornstrup, Allan; Schnopper, Herbert W.; Slane, Patrick O.; Romaine, Suzanne E.; Hoover, Richard B. is a scholarly article available to read on EtoBox.

Author

Christensen, Finn E.; Abdali, Salim; Hornstrup, Allan; Schnopper, Herbert W.; Slane, Patrick O.; Romaine, Suzanne E.; Hoover, Richard B.

Publisher

SPIE

Published

1994

Language

EN