Opening book details…
About this Materials Science article
Tetracene film morphology: Comparative atomic force microscopy, X-ray diffraction and ellipsometry investigations by B. Gompf; D. Faltermeier; C. Redling; M. Dressel; J. Pflaum is a Materials Science article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Materials Science.
- Author
- B. Gompf; D. Faltermeier; C. Redling; M. Dressel; J. Pflaum
- Publisher
- Springer-Verlag; Springer Verlag; Springer Science and Business Media LLC (ISSN 1292-8941)
- Published
- 2008
- Field
- Materials Science (Physical Sciences)
More by B. Gompf; D. Faltermeier; C. Redling; M. Dressel; J. Pflaum
Browse all works by B. Gompf; D. Faltermeier; C. Redling; M. Dressel; J. Pflaum