About this scholarly article

2016 IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S) - In-pixel A/D converters with 120-dB dynamic range using event-driven correlated double sampling for stacked SOI image sensors by Goto, Masahide; Honda, Yuki; Watabe, Toshihisa; Hagiwara, Kei; Nanba, Masakazu; Iguch, Yoshinori; Saraya, Takuya; Kobayashi, Masaharu; Higurashi, Eiji; Toshiyoshi, Hiroshi; Hiramoto, Toshiro is a scholarly article available to read on EtoBox.

Author

Goto, Masahide; Honda, Yuki; Watabe, Toshihisa; Hagiwara, Kei; Nanba, Masakazu; Iguch, Yoshinori; Saraya, Takuya; Kobayashi, Masaharu; Higurashi, Eiji; Toshiyoshi, Hiroshi; Hiramoto, Toshiro

Publisher

IEEE

Published

2016

Language

EN