About this scholarly article

Digest of Papers 1991 VLSI Test Symposium 'Chip-to-System Test Concerns for the 90's - Linear microcircuit fault modeling and detection by Epstein, B.R.; Miller, S.R.; Czigler, M.H.; Gray, D.R. is a scholarly article available to read on EtoBox.

Author

Epstein, B.R.; Miller, S.R.; Czigler, M.H.; Gray, D.R.

Publisher

IEEE

Published

1991