About this scholarly article

2012 19th IEEE International Conference on Electronics, Circuits, and Systems (ICECS 2012) - Offset measurement method for accurate characterization of BTI-induced degradation in opamps by Mahato, Swaraj; De Wit, Pieter; Maricau, Elie; Gielen, Georges is a scholarly article available to read on EtoBox.

Author

Mahato, Swaraj; De Wit, Pieter; Maricau, Elie; Gielen, Georges

Publisher

IEEE

Published

2012

Language

EN