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About this Engineering article
Effect of γ-radiation on HfO2 based MOS capacitor by F. Belgin Ergin; Raşit Turan; Sergiu T. Shishiyanu; Ercan Yilmaz is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- F. Belgin Ergin; Raşit Turan; Sergiu T. Shishiyanu; Ercan Yilmaz
- Publisher
- Elsevier Science; Elsevier ; Elsevier BV (ISSN 0168-583X)
- Published
- 2010
- Language
- EN
- Field
- Engineering (Physical Sciences)
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