About this scholarly article

2009 International Conference on Microelectronics - ICM - New dependability approach for implanted medical devices by Soulier, Fabien; Le Floch, Fanny; Bernard, Serge; Cathebras, Guy is a scholarly article available to read on EtoBox.

Author

Soulier, Fabien; Le Floch, Fanny; Bernard, Serge; Cathebras, Guy

Publisher

IEEE

Published

2009