About this scholarly article

Proceedings International Conference on Microelectronic Test Structures - Statistics for matching by Pergoot, A.; Graindourze, B.; Janssens, E.; Bastos, J.; Steyaert, M.; Kinget, P.; Roovers, R.; Sansen, W. is a scholarly article available to read on EtoBox.

Author

Pergoot, A.; Graindourze, B.; Janssens, E.; Bastos, J.; Steyaert, M.; Kinget, P.; Roovers, R.; Sansen, W.

Publisher

IEEE

Published

1995

Language

EN