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About this Engineering article
Two mode III internal cracks located within two bonded functionally graded piezoelectric half planes respectively by Yi-Liang Ou; Ching-Hwei Chue is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- Yi-Liang Ou; Ching-Hwei Chue
- Publisher
- Springer; Springer-Verlag; Springer Verlag; Springer Science and Business Media LLC; Society for Mining, Metallurgy and Exploration Inc. (ISSN 0939-1533)
- Published
- 2006
- Language
- EN
- Field
- Engineering (Physical Sciences)