About this scholarly article

Proceedings of the 2010 ACM-IEEE International Symposium on Empirical Software Engineering and Measurement - ESEM '10 - Object oriented design pattern decay by Schanz, Travis; Izurieta, Clemente is a scholarly article available to read on EtoBox.

Author

Schanz, Travis; Izurieta, Clemente

Publisher

ACM Press

Published

2010

Language

EN