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About this Engineering article
Hot Carrier Induced Degradation in the Low Temperature Processed Polycrystalline Silicon Thin Film Transistors Using the Dynamic Stress by K. M. Chang; Y. H. Chung; G. M. Lin is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- K. M. Chang; Y. H. Chung; G. M. Lin
- Publisher
- Institute of Pure and Applied Physics; Japan Society of Applied Physics; IOP Publishing (ISSN 0021-4922)
- Published
- 2002
- Field
- Engineering (Physical Sciences)