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About this Engineering article
Dependence of critical current density on oxygen exposure in Nb-AlO/sub x/-Nb tunnel junctions by Kleinsasser, A.W.; Miller, R.E.; Mallison, W.H. is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- Kleinsasser, A.W.; Miller, R.E.; Mallison, W.H.
- Publisher
- IEEE; Institute of Electrical and Electronics Engineers; Institute of Electrical and Electronics Engineers (IEEE) (ISSN 1051-8223)
- Published
- 1995
- Field
- Engineering (Physical Sciences)
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