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Can I read Atomic-scale Surface Structure Determination: Comparison of Techniques on EtoBox?
Atomic-scale Surface Structure Determination: Comparison of Techniques by Van Hove, Michel A. is a Engineering article available to read on EtoBox.
What is Atomic-scale Surface Structure Determination: Comparison of Techniques about?
This article reviews and speculates on the relative capabilities of major techniques for detailed structure determination of surfaces and interfaces. These techniques are primarily low-energy electron diffraction (LEED), x-ray diffraction (XRD), photoelectron diffraction (PD), x-ray absorption fine structure (XAFS), ion scattering (IS) and scanning tunneling microscopy (STM). Their use for more qualitative structural characterization is also briefly considered. The limits of their applicability to various types of surfaces and interfaces are explored: solid-gas, solid-liquid and solid-solid interfaces; non-crystalline surfaces (quasicrystalline, amorphous, liquid); and magnetic structures and imperfect overlayers on crystalline substrates.
Who reads Atomic-scale Surface Structure Determination: Comparison of Techniques?
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- Van Hove, Michel A.
- Publisher
- John Wiley and Sons; Wiley (John Wiley & Sons); John Wiley & Sons Inc.; Wiley; Research Square (ISSN 0142-2421)
- Published
- 1999
- Language
- EN
- Field
- Engineering (Physical Sciences)