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About this Engineering article
Excess carrier lifetime of 3C–SiC measured by the microwave photoconductivity decay method by Ichimura, M. ;Tajiri, H. ;Morita, Y. ;Yamada, N. ;Usami, A. is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- Ichimura, M. ;Tajiri, H. ;Morita, Y. ;Yamada, N. ;Usami, A.
- Publisher
- American Institute of Physics; AIP Publishing (ISSN 0003-6951)
- Published
- 1997
- Field
- Engineering (Physical Sciences)
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