Opening book details…
About this Engineering article
Introducing dependency into IC yield models : Virginia Foard Flack. Solid-St. Electron.28 (6) 555 (1985) is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Publisher
- Elsevier Science; Elsevier ; Elsevier BV (ISSN 0026-2714)
- Published
- 1986
- Field
- Engineering (Physical Sciences)