About this scholarly article

33rd IEEE International Reliability Physics Symposium - An accelerated sodium resistance test for IC passivation films by Hong, C.; Henson, B.; Scelsi, T.; Hance, R. is a scholarly article available to read on EtoBox.

Author

Hong, C.; Henson, B.; Scelsi, T.; Hance, R.

Publisher

IEEE

Published

1995

Language

EN