About this scholarly article

2017 IEEE International Reliability Physics Symposium (IRPS) - Soft error study on DDR4 SDRAMs using a 480 MeV proton beam by Park, Myungsang; Jeon, SangHoon; Bak, GeunYong; Lim, Chulseung; Baeg, Sanghyeon; Wen, ShiJie; Wong, Richard; Yu, Nick is a scholarly article available to read on EtoBox.

Author

Park, Myungsang; Jeon, SangHoon; Bak, GeunYong; Lim, Chulseung; Baeg, Sanghyeon; Wen, ShiJie; Wong, Richard; Yu, Nick

Publisher

IEEE

Published

2017