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Simultaneously Measuring the Refractive Index and Thickness of an Optical Sample by Using Improved Fiber-based Optical Coherence Tomography by Yen, Chih-Ta; Huang, Jen-Fa; Wu, Ming-Jia; Lee, Yu-Fan; Huang, Chia-Tsai; Huang, Shu-Fan; Cheng, Hsu-Chih is a Engineering article available to read on EtoBox.
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- Author
- Yen, Chih-Ta; Huang, Jen-Fa; Wu, Ming-Jia; Lee, Yu-Fan; Huang, Chia-Tsai; Huang, Shu-Fan; Cheng, Hsu-Chih
- Publisher
- The International Society for Optical Engineering; SPIE - International Society for Optical Engineering; S P I E - International Society for Optical Engineering; SPIE-Intl Soc Optical Eng (ISSN 0091-3286)
- Published
- 2014
- Language
- EN
- Field
- Engineering (Physical Sciences)