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About this Engineering article
Ellipsometric Investigations of a Substrate-thin Film System with Rough Boundaries Using the Equivalent Film Theory by K. Brudzewski is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- K. Brudzewski
- Publisher
- Elsevier Science; Elsevier ; Elsevier Sequoia; Elsevier BV (ISSN 0040-6090)
- Published
- 1979
- Language
- EN
- Field
- Engineering (Physical Sciences)