About this scholarly article

2013 IEEE Compound Semiconductor Integrated Circuit Symposium (CSICS) - Base Resistance Scaling for Transistors of Various Geometries by Yang, Yingying; Zampardi, P. J. is a scholarly article available to read on EtoBox.

Author

Yang, Yingying; Zampardi, P. J.

Publisher

IEEE

Published

2013

Language

EN