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Thickness Dependence of Localized States in a Thin Film with Internal Layer Defect by A. Duda; W. Maciejewski is a Physics and Astronomy article available to read on EtoBox.
What is Thickness Dependence of Localized States in a Thin Film with Internal Layer Defect about?
## Abstract The thickness effect in the spin‐wave spectrum of a thin film withone internal layer defect is studied. The behaviour of the localized modes and their generation conditions under variation of the film thickness are described by strictly derived analytic formulac. The shape of the thickness effect is related to the pinning situations of the surface spins.
Who reads Thickness Dependence of Localized States in a Thin Film with Internal Layer Defect?
It is typically read by researchers, students, and practitioners in Physics and Astronomy.
- Author
- A. Duda; W. Maciejewski
- Publisher
- John Wiley and Sons; Wiley (John Wiley & Sons); John Wiley & Sons Ltd.; Wiley (ISSN 0370-1972)
- Published
- 1976
- Language
- EN
- Field
- Physics and Astronomy (Physical Sciences)