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About this Engineering article
In Situ Impact Analysis of Very High Heat Flux Transients on Nonlinear p-n Diode Characteristics and Mitigation Using On-Chip Single- and Two-Phase Microfluidics by S. G. Singh; S. P. Duttagupta; A. Agrawal is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- S. G. Singh; S. P. Duttagupta; A. Agrawal
- Publisher
- IEEE; Institute of Electrical and Electronics Engineers; Institute of Electrical and Electronics Engineers (IEEE) (ISSN 1057-7157)
- Published
- 2009
- Language
- EN
- Field
- Engineering (Physical Sciences)
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