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About this Materials Science article
X-Ray photoelectron spectroscopy investigation of direct process contact masses by Thomas M. Gentle; Michael J. Owen is a Materials Science article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Materials Science.
- Author
- Thomas M. Gentle; Michael J. Owen
- Publisher
- Elsevier Science; Elsevier ; Elsevier Inc.; Elsevier BV (ISSN 0021-9517)
- Published
- 1987
- Language
- EN
- Field
- Materials Science (Physical Sciences)