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About this Physics and Astronomy article

An Analytic Geometry‐Variant Approach to Line Ratio Enhancement above the Optically Thin Limit by Kerr, F. M.; Rose, S. J.; Wark, J. S.; Keenan, F. P. is a Physics and Astronomy article available to read on EtoBox.

It is typically read by researchers, students, and practitioners in Physics and Astronomy.

Author
Kerr, F. M.; Rose, S. J.; Wark, J. S.; Keenan, F. P.
Publisher
University of Chicago Press; American Astronomical Society; Institute of Physics Publishing; IOP Publishing; Oxford University Press (OUP) (ISSN 0004-637X)
Published
2005
Language
EN
Field
Physics and Astronomy (Physical Sciences)