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About this Engineering article
Sensitivity of Microwave Imaging Systems Employing Scattering-Parameter Measurements by Moussakhani, Kaveh (author);McCombe, Justin J. (author);Nikolova, Natalia K. (author) is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- Moussakhani, Kaveh (author);McCombe, Justin J. (author);Nikolova, Natalia K. (author)
- Publisher
- Institute of Electrical and Electronics Engineers Inc.
- Published
- 2014
- Field
- Engineering (Physical Sciences)