Opening book details…
About this Engineering article
Phase transformation behaviors of SiO[sub 2] doped Ge[sub 2]Sb[sub 2]Te[sub 5] films for application in phase change random access memory by S. W. Ryu; J. H. Oh; J. H. Lee; B. J. Choi; W. Kim; S. K. Hong; C. S. Hwang; H. J. Kim is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- S. W. Ryu; J. H. Oh; J. H. Lee; B. J. Choi; W. Kim; S. K. Hong; C. S. Hwang; H. J. Kim
- Publisher
- American Institute of Physics; AIP Publishing (ISSN 0003-6951)
- Published
- 2008
- Language
- EN
- Field
- Engineering (Physical Sciences)