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About this Materials Science article
Investigating Defect Contrast in GeXSh1-x/Si Epitaxial Structures Using Electron Channeling Contrast Imaging by Tessmer, Joseph; DeGraef, Marc; Picard, Yoosuf N. is a Materials Science article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Materials Science.
- Author
- Tessmer, Joseph; DeGraef, Marc; Picard, Yoosuf N.
- Publisher
- Cambridge University Press; Cambridge University Press (CUP) (ISSN 1431-9276)
- Published
- 2017
- Field
- Materials Science (Physical Sciences)
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