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About this Engineering article
VI-7 ESR signatures of defects near the Si/SiO2interface by Poindexter, E.H.; Helbert, J.N.; Wagner, B.E.; Caplan, P.J. is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- Poindexter, E.H.; Helbert, J.N.; Wagner, B.E.; Caplan, P.J.
- Publisher
- IEEE; Institute of Electrical and Electronics Engineers; Institute of Electrical and Electronics Engineers (IEEE) (ISSN 0018-9383)
- Published
- 1977
- Field
- Engineering (Physical Sciences)
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