About this scholarly article

2015 28th International Conference on VLSI Design - Can You Trust Your Memory Trace? A Comparison of Memory Traces from Binary Instrumentation and Simulation by Nilakantan, Siddharth; Lerner, Scott; Hempstead, Mark; Taskin, Baris is a scholarly article available to read on EtoBox.

Author

Nilakantan, Siddharth; Lerner, Scott; Hempstead, Mark; Taskin, Baris

Publisher

IEEE

Published

2015