About this scholarly article

2007 International Semiconductor Device Research Symposium - SiGe HBT compact modeling for extreme temperatures by Woods, Beth O.; Mantooth, H. Alan; Cressler, John D. is a scholarly article available to read on EtoBox.

Author

Woods, Beth O.; Mantooth, H. Alan; Cressler, John D.

Publisher

IEEE

Published

2007

Language

EN