About this scholarly article

2016 10th IEEE International Conference on Anti-counterfeiting, Security, and Identification (ASID) - Analysis of multiple factors and electrode velocity effect on ESD in micro-air gap by Shunli Yao, ; Fangming Ruan, ; Xiaojin You, ; Ming Su, ; Xiaohong Yang, ; Jun Huang, ; Junhua Zhang, is a scholarly article available to read on EtoBox.

Author

Shunli Yao, ; Fangming Ruan, ; Xiaojin You, ; Ming Su, ; Xiaohong Yang, ; Jun Huang, ; Junhua Zhang,

Publisher

IEEE

Published

2016