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Probing the Interface Barriers of Dopant-Segregated Silicide–Si Diodes With Internal Photoemission by Zhang, Z.; Atkin, J.; Hopstaken, M.; Hatzistergos, M.; Ronsheim, P.; Liniger, E.; Laibowitz, R.; Solomon, P. M. is a Engineering article available to read on EtoBox.

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Author
Zhang, Z.; Atkin, J.; Hopstaken, M.; Hatzistergos, M.; Ronsheim, P.; Liniger, E.; Laibowitz, R.; Solomon, P. M.
Publisher
IEEE; Institute of Electrical and Electronics Engineers; Institute of Electrical and Electronics Engineers (IEEE) (ISSN 0018-9383)
Published
2012
Language
EN
Field
Engineering (Physical Sciences)

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