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About this Materials Science article
The thickness dependence of anisotropic magnetoresistance in a Co35Pd65 film by S.U. Jen; C.T. Wei; J.Y. Huang is a Materials Science article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Materials Science.
- Author
- S.U. Jen; C.T. Wei; J.Y. Huang
- Publisher
- Elsevier Science; Elsevier ; Elsevier BV (ISSN 0304-8853)
- Published
- 1996
- Language
- EN
- Field
- Materials Science (Physical Sciences)