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About this Engineering article
Transmission electron microscopy of NdNiO 3 thin films on silicon substrates by Laffez, P.; Retoux, R.; Boullay, P.; Zaghrioui, M.; Lacorre, P.; van Tendeloo, G. is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- Laffez, P.; Retoux, R.; Boullay, P.; Zaghrioui, M.; Lacorre, P.; van Tendeloo, G.
- Publisher
- EDP Sciences (ISSN 1286-0042)
- Published
- 2000
- Language
- EN
- Field
- Engineering (Physical Sciences)