About this scholarly article

2018 IEEE 30th International Symposium on Power Semiconductor Devices and ICs (ISPSD) - Repetitive surge current test of SiC MPS diode with load in bipolar regime by Palanisamy, Shanmuganathan; Kowalsky, Jens; Lutz, Josef; Basler, Thomas; Rupp, Roland; Moazzami-Fallah, Jasmin is a scholarly article available to read on EtoBox.

Author

Palanisamy, Shanmuganathan; Kowalsky, Jens; Lutz, Josef; Basler, Thomas; Rupp, Roland; Moazzami-Fallah, Jasmin

Publisher

IEEE

Published

2018