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SPIE Proceedings [SPIE International Conference on Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics - Kiev, Ukraine (Tuesday 13 May 1997)] Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics 1997 - Optical and photoelectric- and gas-sensitive properties of porous silicon by Smyntyna, Valentin A.; Vashpanov, Yurij A.; Svechnikov, Sergey V.; Valakh, Mikhail Y. is a scholarly article available to read on EtoBox.

Author
Smyntyna, Valentin A.; Vashpanov, Yurij A.; Svechnikov, Sergey V.; Valakh, Mikhail Y.
Publisher
SPIE
Published
1998
Language
EN