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About this Engineering article
Comparison of Four-probe Thermal and Thermoelectric Transport Measurements of Thin Films and Nanostructures with Microfabricated Electro-thermal Transducers by Kim, Jaehyun; Fleming, Evan; Zhou, Yuanyuan; Shi, Li is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- Kim, Jaehyun; Fleming, Evan; Zhou, Yuanyuan; Shi, Li
- Publisher
- Institute of Physics; IOP Publishing; Institute of Physics Publishing (ISSN 0022-3727)
- Published
- 2018
- Field
- Engineering (Physical Sciences)
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